Session 3

Friday, May 30th 2008 - 8.30 to 10.30

Reliability labs: (characterization, test, design ... Services and Public lab Case studies) this session will finish with a debate on gap analysis between manufacturer offer and end user needs.

Introduction speaker : NOVA MEMS : Xavier Lafontan
CEA : Didier Bloch "MEMS Failure Analysis : CEA-LETI activities introduction + Case Study "
LIRMM : Norbert Dumas "MEMS tests (embedded / in prod chain)"
LAAS : Fabio Coccetti "RF-MEMS Reliability Status and Prespectives"
XLIM : Arnaud Pothier + Pierre Blondy "Reliability Study of Dielectric Less Electrostatic Actuators: Application to MEMS Switches"